Akrometrix has been supplying thermal warpage systems for more than 20 years utilising the shadow moiré technique. This next-generation AXP system provides unparalleled warpage metrology with lateral/top-bottom temperature uniformity.
AXP 2.0 has optional modules for both DIC strain/CTE measurements and DFP for discontinuous surfaces. Utilising a novel combination of both top and bottom heaters with shadow moiré, Akrometrix is providing temperature uniformity previously unattainable in the industry on a flexible/configurable platform.