The paper, which reports a phenomenon that explains a major contribution to the reliability of Nihon Superior’s SN100C® solder alloy, was co-authored by Stuart McDonald, Hideaki Tsukamoto and Jonathan Read of the University of Queensland, the president of Nihon Superior, Tetsuro Nishimura, and Shoichi Suenaga of Nihon Superior.
The authors successfully developed a method of limiting cracking in the Cu6Sn5 intermetallic compounds, which are formed at the interface between lead-free solders and their Cu substrates. In this paper, it is shown that the level of cracking in the (Cu,Ni)6Sn5 reaction layer and the morphology of the intermatallics varies with the Ni content. To explore the mechanisms associated with the differences in joint integrity, detailed synchrotron X-ray powder diffraction (XRD) has been used with Rietveld analysis. The results show Ni stabilizes a high-temperature allotrope of the Cu6Sn5 phase, avoiding stresses induced by a volumetric change that would otherwise occur on phase transformation.