Computrol Selects Fischer Technology’s XDAL® 237 XRF

Computrol, Inc.,announces that it has acquired Fischer Technology’s XDAL 237 X-Ray Fluorescence system. This system will further enhance Computrol’s incoming inspection capabilities in terms of measuring coating thicknesses and conducting material analysis on incoming raw parts and PCBs, thus providing the company and its customers with an added assurance that materials have been verified to conform to individual customer-set standards.

byNews Desk

July 22, 2010

The system is expected to be fully operational by August 1, 2010.

“In addition to Fisher’s high reputation for reliability, the XDAL 237 XRF was chosen for its superior performance and ease of use. The system is loaded with standard features that makes it very attractive,” said Farid Anani, Computrol’s Engineering Manager.

The FISCHERSCOPE® X-RAY XDAL is an X-Ray spectrometer for quantitative materials analysis, features the advantages of a large, high-precision XY(Z)-measuring stage in combination with a semiconductor detector. Its high energy resolution allows the XDAL® to provide reliable analysis results and coating thickness measurements with short measuring times. For more information about the system, visit Fischer Technology Inc. at www.fischer-technology.com.